INVESTIGATE HETEROGENEITY AND IDENTIFY CONTAMINANTS ON MULTI-LAYER LAMINATES, SILICON WAFERS, LCD SCREENS, AND PAPER PRODUCTS.

With Varian FT-IR systems, see more than ever — fast!

As manufacturing processes and associated materials become more advanced, multi-layer materials and polymers (especially the adhesive layers in polymer laminates) are becoming thinner and therefore more difficult to analyze using traditional FT-IR microscopy.

With Varian's patented micro and macro ATR Focal Plane Array (FPA) imaging system, resolve sample layers of only a few microns (well below the air diffraction limit). Use the unique software capabilities to monitor the "live" infrared image and ensure optimum contact at the moment of ATR measurement, ensuring the maintenance of sample integrity that is not possible with alternative systems.

Perform both microscopic and macroscopic measurements using the multiple measurement modes of Varian's infrared microscopes, including transmission, reflection, attenuated total reflectance (ATR), grazing angle reflection analysis and patented 'large sample' mode. Ideal for advanced materials characterization, Varian microscopes are simple to use, provide the best sensitivity and versatility, and can be customized to suit a desired area of analysis. With infrared mapping, and chemical imaging using a focal plane array detector, Varian's systems give you superior quality information, even from challenging samples, in the shortest possible time.

Infrared imaging analysis goes beyond visible sample characterization to provide chemical information about product failure of functional films in LCD screens. The ability to acquire data at such a high spatial resolution from several small beads and their surroundings provided a comprehensive means of troubleshooting product defects in the manufacturing process. Easy sample visualization tools let you investigate the samples in 2-D and 3-D chemical view in order to improve process control.

Whether it is the identification of 3 micron adhesive layers in multilayer laminates, the orientation of surface-bound monolayer species on silicon, or the identification of contaminants on manufactured paper and cardboard products, Varian's FT-IR spectroscopy range provides an arsenal of analytical techniques to solve your analytical challenge.

Discovering the chemical reasons for component failure of LCD filters using micro-ATR imaging with a FPA detector. Visible images (top left), chemical images (top center and right), and one of thousands of IR spectra (bottom) that were collected in seconds allowing the source of the inorganic contaminants to be identified.

Varian's unique ability to see the chemical image in real-time during ATR-sample contact ensured that there was no sample deformation during routine quality control analysis of this LCD screen. The foreign material under investigation was quickly identified as a skin flake.

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Application Note: FT-IR Microscopy and Imaging for Failure Analysis in Electronics Manufacturing

Application Note: Material Analysis by Infrared Mapping: A Case Study Using a Multi-layer Paint Sample